A novel method for reducing high attenuation object artifacts in CT reconstructions

Laigao Chen, Yun Liang, George A. Sandison, Jonas Rydberg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations

Abstract

A new method to reduce the streak artifacts caused by high attenuation objects in CT images has been developed. The key part of this approach is a preprocessing procedure based on the raw projection data using an adaptive scaling-plus-filtering method. The procedure is followed by the conventional filtered-back projection to reconstruct artifact-reduced images. Phantom and clinical studies have demonstrated that the proposed method can effectively reduce the streak artifacts caused by high attenuation objects for different anatomical structures and metal materials while still faithfully reproduce the positions and dimensions of the metal objects. The visualization of tissue features adjacent to metal objects is greatly improved. The proposed method is computational efficient and can be easily adapted to the current commercial CT scanners.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsM. Sonka, J. Michael Fitzpatrick
Pages841-850
Number of pages10
Volume4684 II
DOIs
StatePublished - 2002
EventMedical Imaging 2002: Image Processing - San Diego, CA, United States
Duration: Feb 24 2002Feb 28 2002

Other

OtherMedical Imaging 2002: Image Processing
CountryUnited States
CitySan Diego, CA
Period2/24/022/28/02

Keywords

  • Beam hardening correction
  • Computed tomography (CT)
  • High attenuation object artifacts
  • Metal artifact reduction

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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    Chen, L., Liang, Y., Sandison, G. A., & Rydberg, J. (2002). A novel method for reducing high attenuation object artifacts in CT reconstructions. In M. Sonka, & J. Michael Fitzpatrick (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4684 II, pp. 841-850) https://doi.org/10.1117/12.467232