Ionization chamber shift correction and surface dose measurements in electron beams

Indra J. Das, Shawn W. McNeeley, Chee W. Cheng

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Cylindrical ionization chambers produce perturbations (gradient and fluence) in the medium, and hence the point of measurement is not accurately defined in electron beam dosimetry. The gradient perturbation is often corrected by a shift method depending on the type of ion chamber. The shift is in the range of 0.33-0.85 times the inner radius (r) of the ion chamber, upstream from the centre of the chamber, depending upon the dosimetry protocol. This variation in shift causes the surface dose to be uncertain due to the high dose gradient. An investigation was conducted to estimate the effective point of measurement of cylindrical ion chambers in electron beams. Ionization measurements were taken with the ion chamber in air and in a phantom at source to chamber distances of 100 cm respectively. The data in air and in the phantom were fitted with the inverse square and electron depth dose functions, respectively. The intersection of the two functions provides an accurate estimate of the ion chamber shift and the surface dose. Our results show that the shift correction for an ion chamber is energy dependent. The measured shifts vary from 0.9r to 0.5r between 6 MeV and 20 MeV beams respectively. The surface dose measured with the ion chambers and mathematically determined values are in agreement to within 3%. The method presented in this report is unambiguous, fast and reliable for the estimation of surface dose and the shift needed in electron beam dosimetry.

Original languageEnglish (US)
Pages (from-to)3419-3424
Number of pages6
JournalPhysics in Medicine and Biology
Volume43
Issue number11
DOIs
StatePublished - Nov 1998
Externally publishedYes

Fingerprint

Ionization chambers
ionization chambers
Dosimetry
Electron beams
electron beams
Electrons
Ions
dosage
shift
dosimeters
gradients
Air
chambers
perturbation
air
estimates
intersections
upstream
Ionization
fluence

ASJC Scopus subject areas

  • Biomedical Engineering
  • Physics and Astronomy (miscellaneous)
  • Radiology Nuclear Medicine and imaging
  • Radiological and Ultrasound Technology

Cite this

Ionization chamber shift correction and surface dose measurements in electron beams. / Das, Indra J.; McNeeley, Shawn W.; Cheng, Chee W.

In: Physics in Medicine and Biology, Vol. 43, No. 11, 11.1998, p. 3419-3424.

Research output: Contribution to journalArticle

Das, Indra J. ; McNeeley, Shawn W. ; Cheng, Chee W. / Ionization chamber shift correction and surface dose measurements in electron beams. In: Physics in Medicine and Biology. 1998 ; Vol. 43, No. 11. pp. 3419-3424.
@article{1d6be6513d094b2cbd74ac97232bf629,
title = "Ionization chamber shift correction and surface dose measurements in electron beams",
abstract = "Cylindrical ionization chambers produce perturbations (gradient and fluence) in the medium, and hence the point of measurement is not accurately defined in electron beam dosimetry. The gradient perturbation is often corrected by a shift method depending on the type of ion chamber. The shift is in the range of 0.33-0.85 times the inner radius (r) of the ion chamber, upstream from the centre of the chamber, depending upon the dosimetry protocol. This variation in shift causes the surface dose to be uncertain due to the high dose gradient. An investigation was conducted to estimate the effective point of measurement of cylindrical ion chambers in electron beams. Ionization measurements were taken with the ion chamber in air and in a phantom at source to chamber distances of 100 cm respectively. The data in air and in the phantom were fitted with the inverse square and electron depth dose functions, respectively. The intersection of the two functions provides an accurate estimate of the ion chamber shift and the surface dose. Our results show that the shift correction for an ion chamber is energy dependent. The measured shifts vary from 0.9r to 0.5r between 6 MeV and 20 MeV beams respectively. The surface dose measured with the ion chambers and mathematically determined values are in agreement to within 3{\%}. The method presented in this report is unambiguous, fast and reliable for the estimation of surface dose and the shift needed in electron beam dosimetry.",
author = "Das, {Indra J.} and McNeeley, {Shawn W.} and Cheng, {Chee W.}",
year = "1998",
month = "11",
doi = "10.1088/0031-9155/43/11/016",
language = "English (US)",
volume = "43",
pages = "3419--3424",
journal = "Physics in Medicine and Biology",
issn = "0031-9155",
publisher = "IOP Publishing Ltd.",
number = "11",

}

TY - JOUR

T1 - Ionization chamber shift correction and surface dose measurements in electron beams

AU - Das, Indra J.

AU - McNeeley, Shawn W.

AU - Cheng, Chee W.

PY - 1998/11

Y1 - 1998/11

N2 - Cylindrical ionization chambers produce perturbations (gradient and fluence) in the medium, and hence the point of measurement is not accurately defined in electron beam dosimetry. The gradient perturbation is often corrected by a shift method depending on the type of ion chamber. The shift is in the range of 0.33-0.85 times the inner radius (r) of the ion chamber, upstream from the centre of the chamber, depending upon the dosimetry protocol. This variation in shift causes the surface dose to be uncertain due to the high dose gradient. An investigation was conducted to estimate the effective point of measurement of cylindrical ion chambers in electron beams. Ionization measurements were taken with the ion chamber in air and in a phantom at source to chamber distances of 100 cm respectively. The data in air and in the phantom were fitted with the inverse square and electron depth dose functions, respectively. The intersection of the two functions provides an accurate estimate of the ion chamber shift and the surface dose. Our results show that the shift correction for an ion chamber is energy dependent. The measured shifts vary from 0.9r to 0.5r between 6 MeV and 20 MeV beams respectively. The surface dose measured with the ion chambers and mathematically determined values are in agreement to within 3%. The method presented in this report is unambiguous, fast and reliable for the estimation of surface dose and the shift needed in electron beam dosimetry.

AB - Cylindrical ionization chambers produce perturbations (gradient and fluence) in the medium, and hence the point of measurement is not accurately defined in electron beam dosimetry. The gradient perturbation is often corrected by a shift method depending on the type of ion chamber. The shift is in the range of 0.33-0.85 times the inner radius (r) of the ion chamber, upstream from the centre of the chamber, depending upon the dosimetry protocol. This variation in shift causes the surface dose to be uncertain due to the high dose gradient. An investigation was conducted to estimate the effective point of measurement of cylindrical ion chambers in electron beams. Ionization measurements were taken with the ion chamber in air and in a phantom at source to chamber distances of 100 cm respectively. The data in air and in the phantom were fitted with the inverse square and electron depth dose functions, respectively. The intersection of the two functions provides an accurate estimate of the ion chamber shift and the surface dose. Our results show that the shift correction for an ion chamber is energy dependent. The measured shifts vary from 0.9r to 0.5r between 6 MeV and 20 MeV beams respectively. The surface dose measured with the ion chambers and mathematically determined values are in agreement to within 3%. The method presented in this report is unambiguous, fast and reliable for the estimation of surface dose and the shift needed in electron beam dosimetry.

UR - http://www.scopus.com/inward/record.url?scp=0031741894&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031741894&partnerID=8YFLogxK

U2 - 10.1088/0031-9155/43/11/016

DO - 10.1088/0031-9155/43/11/016

M3 - Article

C2 - 9832024

AN - SCOPUS:0031741894

VL - 43

SP - 3419

EP - 3424

JO - Physics in Medicine and Biology

JF - Physics in Medicine and Biology

SN - 0031-9155

IS - 11

ER -