Surface-based morphometric analysis of hippocampal subfields in mild cognitive impairment and Alzheimer's disease

Shan Cong, Maher Rizkalla, Paul Salama, John West, Shannon Risacher, Andrew Saykin, Li Shen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

The hippocampus is widely studied with neuroimaging techniques given its importance in learning and memory and its potential as a biomarker for Alzheimer's disease (AD). Its complex folding anatomy often presents analytical challenges. In particular, the critical subfield information is typically not addressed by the existing hippocampal shape studies. To bridge this gap, we present a computational framework for surface-based morphometric analysis of hippocampal subfields. The major strengths of this framework are as follows: (a) it performs detailed hippocampal shape analysis, (b) it embraces, rather than ignores, the important hippocampal subfield information, and (c) it analyzes regular magnetic resonance imaging scans and is applicable to large scale studies. We demonstrate its effectiveness by applying it to the identification of regional hippocampal subfield atrophy patterns associated with mild cognitive impairment and AD.

Original languageEnglish (US)
Title of host publicationMidwest Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2015-September
ISBN (Print)9781467365574
DOIs
StatePublished - Sep 28 2015
Event58th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2015 - Fort Collins, United States
Duration: Aug 2 2015Aug 5 2015

Other

Other58th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2015
CountryUnited States
CityFort Collins
Period8/2/158/5/15

Fingerprint

Neuroimaging
Biomarkers
Magnetic resonance
Imaging techniques
Data storage equipment

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Cong, S., Rizkalla, M., Salama, P., West, J., Risacher, S., Saykin, A., & Shen, L. (2015). Surface-based morphometric analysis of hippocampal subfields in mild cognitive impairment and Alzheimer's disease. In Midwest Symposium on Circuits and Systems (Vol. 2015-September). [7282173] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSCAS.2015.7282173

Surface-based morphometric analysis of hippocampal subfields in mild cognitive impairment and Alzheimer's disease. / Cong, Shan; Rizkalla, Maher; Salama, Paul; West, John; Risacher, Shannon; Saykin, Andrew; Shen, Li.

Midwest Symposium on Circuits and Systems. Vol. 2015-September Institute of Electrical and Electronics Engineers Inc., 2015. 7282173.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cong, S, Rizkalla, M, Salama, P, West, J, Risacher, S, Saykin, A & Shen, L 2015, Surface-based morphometric analysis of hippocampal subfields in mild cognitive impairment and Alzheimer's disease. in Midwest Symposium on Circuits and Systems. vol. 2015-September, 7282173, Institute of Electrical and Electronics Engineers Inc., 58th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2015, Fort Collins, United States, 8/2/15. https://doi.org/10.1109/MWSCAS.2015.7282173
Cong S, Rizkalla M, Salama P, West J, Risacher S, Saykin A et al. Surface-based morphometric analysis of hippocampal subfields in mild cognitive impairment and Alzheimer's disease. In Midwest Symposium on Circuits and Systems. Vol. 2015-September. Institute of Electrical and Electronics Engineers Inc. 2015. 7282173 https://doi.org/10.1109/MWSCAS.2015.7282173
Cong, Shan ; Rizkalla, Maher ; Salama, Paul ; West, John ; Risacher, Shannon ; Saykin, Andrew ; Shen, Li. / Surface-based morphometric analysis of hippocampal subfields in mild cognitive impairment and Alzheimer's disease. Midwest Symposium on Circuits and Systems. Vol. 2015-September Institute of Electrical and Electronics Engineers Inc., 2015.
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